Electronics / Semiconductors Materials Testing

Both inorganic and organic analyses are indispensable for electronics industry and related chemical industries. Purposes for analysis are wide ranging, and data generated can give much insight for research/development, reduction of defects, conforming to regulations and increasing productivity, all of which will contribute to delivering better products to consumers with diminished impact on our environment. This application handbook is a compilation of case studies where analytical techniques are playing critical roles in various parts of electronic industries. It demonstrates the range of analytical solutions provided by Shimadzu, from simple evaluation test to combinatorial use of inorganic and organic analytical methods. We are hoping that you will find the solution that addresses your needs.

Before measuring life time properties it is also important to measure the particle size distribution from the additive material, this can be measured with SALD-2300. Measurements in a range from 17 nm up to 2500 µm. With the rise of metal powder-based additive manufacturing and its acceptance for critical applications, it has become important to understand the behavior of the raw materials used in different AM Techniques.

This article introduces three example analyses: analysis of EVA film subjected to intense UV irradiation using a UV (ultraviolet) -Py (double-shot pyrolyzer) / GC-MS (gas chromatograph mass spectrometer) system, evolved gas analysis by mass spectrometry (EGA-MS) of EVA film which was degraded by UV irradiation in the same way as with the above, and analysis of the same using a Fourier transform infrared spectrophotometer (FTIR).